http://rdf.ncbi.nlm.nih.gov/pubchem/patent/TW-201505087-A

Outgoing Links

Predicate Object
assignee http://rdf.ncbi.nlm.nih.gov/pubchem/patentassignee/MD5_0543b7dcc7c8cd8091e1f977762f3712
classificationCPCInventive http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/H01L21-30608
http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/G05B19-418
http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/H01L21-67075
http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/H01L21-4835
http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/H01L21-31111
http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/H01L21-67017
http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/H01L21-32134
http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/H01L21-02019
http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/H01L21-6708
classificationIPCInventive http://rdf.ncbi.nlm.nih.gov/pubchem/patentipc/H01L21-306
filingDate 2014-03-14-04:00^^<http://www.w3.org/2001/XMLSchema#date>
inventor http://rdf.ncbi.nlm.nih.gov/pubchem/patentinventor/MD5_d3e3278093cec828b99ae525ff2d4c30
http://rdf.ncbi.nlm.nih.gov/pubchem/patentinventor/MD5_411c7142496c7848ae40c5d910adceb2
publicationDate 2015-02-01-04:00^^<http://www.w3.org/2001/XMLSchema#date>
publicationNumber TW-201505087-A
titleOfInvention Processing system and method for providing heated etching solution
abstract The present invention provides a method and processing system for independent temperature and hydration control of an etching solution for processing a wafer in a processing chamber. The method comprises the steps of: circulating an etching solution in a circulation loop; maintaining the etching solution at a hydration set point by adding water to the etching solution or removing water from the etching solution; maintaining the etching solution at a temperature set point, the temperature The set point is lower than the boiling point of the etching solution in the recycle loop; and the etching solution is dispensed into the processing chamber for processing the wafer. In one embodiment, the dispensing step includes: dispensing an etching solution into a processing region in the processing chamber adjacent to the wafer; introducing steam into an outer region of the processing chamber away from the wafer; and etching the solution and steam To process the wafer.
priorityDate 2013-03-15-04:00^^<http://www.w3.org/2001/XMLSchema#date>
type http://data.epo.org/linked-data/def/patent/Publication

Incoming Links

Predicate Subject
isDiscussedBy http://rdf.ncbi.nlm.nih.gov/pubchem/substance/SID419512635
http://rdf.ncbi.nlm.nih.gov/pubchem/substance/SID452895221
http://rdf.ncbi.nlm.nih.gov/pubchem/substance/SID411550722
http://rdf.ncbi.nlm.nih.gov/pubchem/compound/CID1004
http://rdf.ncbi.nlm.nih.gov/pubchem/compound/CID962
http://rdf.ncbi.nlm.nih.gov/pubchem/compound/CID22023151

Total number of triples: 26.