http://rdf.ncbi.nlm.nih.gov/pubchem/patent/TW-201501310-A

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classificationCPCInventive http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/H01L29-7869
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filingDate 2014-04-14-04:00^^<http://www.w3.org/2001/XMLSchema#date>
inventor http://rdf.ncbi.nlm.nih.gov/pubchem/patentinventor/MD5_86278739d78f82e4e8019458d88aea98
publicationDate 2015-01-01-04:00^^<http://www.w3.org/2001/XMLSchema#date>
publicationNumber TW-201501310-A
titleOfInvention Semiconductor device
abstract One of the objects of the present invention is to provide a semiconductor device using an oxide semiconductor with good electrical characteristics. An object of the present invention is to provide a highly reliable semiconductor device in which variation in electrical characteristics of a semiconductor device using an oxide semiconductor is suppressed. The semiconductor device includes: an island-shaped semiconductor layer on a base insulating layer; a pair of electrodes on the semiconductor layer; a barrier layer contacting the bottom surface of the electrode; a gate electrode on the semiconductor layer; and a semiconductor layer and the gate electrode The gate insulation layer. Further, the semiconductor layer comprises an oxide semiconductor, the insulating base layer comprises hafnium oxide or hafnium oxynitride, the electrode comprises Al, Cr, Cu, Ta, Ti, Mo or W, and the barrier layer comprises an oxide comprising an oxide semiconductor One or more of the metal elements contained. Further, when viewed in plan, the electrode and the barrier layer extend to the outside of the semiconductor layer.
isCitedBy http://rdf.ncbi.nlm.nih.gov/pubchem/patent/CN-111542914-A
priorityDate 2013-05-01-04:00^^<http://www.w3.org/2001/XMLSchema#date>
type http://data.epo.org/linked-data/def/patent/Publication

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