http://rdf.ncbi.nlm.nih.gov/pubchem/patent/TW-201443451-A
Outgoing Links
| Predicate | Object |
|---|---|
| assignee | http://rdf.ncbi.nlm.nih.gov/pubchem/patentassignee/MD5_f743e83fa1317f663472b53b44d3636c |
| classificationIPCInventive | http://rdf.ncbi.nlm.nih.gov/pubchem/patentipc/G01R31-28 http://rdf.ncbi.nlm.nih.gov/pubchem/patentipc/G01R31-26 |
| filingDate | 2013-05-07-04:00^^<http://www.w3.org/2001/XMLSchema#date> |
| inventor | http://rdf.ncbi.nlm.nih.gov/pubchem/patentinventor/MD5_4097bdcd26e13fecde1fdd1fa43a00ba |
| publicationDate | 2014-11-16-04:00^^<http://www.w3.org/2001/XMLSchema#date> |
| publicationNumber | TW-201443451-A |
| titleOfInvention | Test module |
| abstract | The invention discloses a test module, comprising a test disc and a test substrate, and using the conductor on the test disc, the test substrate of the wafer test machine can be aligned with all the wafers at one time, and the test is performed at the same time, which reduces the large number of man-hours of the process. And increase the tester's income, and will also have a positive effect on the progress of the follow-up products. |
| isCitedBy | http://rdf.ncbi.nlm.nih.gov/pubchem/patent/CN-106707141-A |
| priorityDate | 2013-05-07-04:00^^<http://www.w3.org/2001/XMLSchema#date> |
| type | http://data.epo.org/linked-data/def/patent/Publication |
Incoming Links
Total number of triples: 18.