http://rdf.ncbi.nlm.nih.gov/pubchem/patent/TW-201234025-A
Outgoing Links
| Predicate | Object |
|---|---|
| assignee | http://rdf.ncbi.nlm.nih.gov/pubchem/patentassignee/MD5_520938f946eec0ddfda8daa1b44ef9a2 |
| classificationCPCInventive | http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/H05K7-20254 http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/G01R31-2877 http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/H05K7-20136 http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/G01R31-2874 |
| classificationIPCInventive | http://rdf.ncbi.nlm.nih.gov/pubchem/patentipc/G01R31-28 http://rdf.ncbi.nlm.nih.gov/pubchem/patentipc/G01R31-26 |
| filingDate | 2011-11-22-04:00^^<http://www.w3.org/2001/XMLSchema#date> |
| inventor | http://rdf.ncbi.nlm.nih.gov/pubchem/patentinventor/MD5_ae9f60ecfc5f5942cfd93743538cccba http://rdf.ncbi.nlm.nih.gov/pubchem/patentinventor/MD5_aef55aeb58e5804302bf27a73921ae57 http://rdf.ncbi.nlm.nih.gov/pubchem/patentinventor/MD5_2b343517c0873d69cac858753d6e9e1d http://rdf.ncbi.nlm.nih.gov/pubchem/patentinventor/MD5_e711430c9ea65599dc33dd0476ef6935 |
| publicationDate | 2012-08-16-04:00^^<http://www.w3.org/2001/XMLSchema#date> |
| publicationNumber | TW-201234025-A |
| titleOfInvention | Automatic semiconductor testing machine with temperature control system |
| abstract | Disclosed is an automatic semiconductor testing machine with a temperature control system. The automatic semiconductor testing machine comprises at least one testing arm. The testing arm has a front end to which a testing head is mounted. The testing arm is provided with a closed-loop cooling circulation system. The closed-loop cooling circulation system comprises a channel, which is in contact with a cooling device and contains internally a working fluid. The channel is connected to the testing head, the cooling device, a set of fans, and a drive source for driving the working fluid. The closed-loop cooling circulation system functions to circulate and exchange thermal energy generated by a component to be tested that is downward pressed tightly by the testing arm. The set of fans drive air flow to effectuate heat exchange with the cooling device in order to dissipate the thermal energy so generated. |
| isCitedBy | http://rdf.ncbi.nlm.nih.gov/pubchem/patent/TW-I559011-B |
| priorityDate | 2011-11-22-04:00^^<http://www.w3.org/2001/XMLSchema#date> |
| type | http://data.epo.org/linked-data/def/patent/Publication |
Incoming Links
| Predicate | Subject |
|---|---|
| isDiscussedBy | http://rdf.ncbi.nlm.nih.gov/pubchem/substance/SID418354341 http://rdf.ncbi.nlm.nih.gov/pubchem/compound/CID23978 |
Total number of triples: 21.