http://rdf.ncbi.nlm.nih.gov/pubchem/patent/TW-201012303-A

Outgoing Links

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assignee http://rdf.ncbi.nlm.nih.gov/pubchem/patentassignee/MD5_fd221d21998567268ab28734915df324
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classificationCPCInventive http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/G01N23-046
classificationIPCInventive http://rdf.ncbi.nlm.nih.gov/pubchem/patentipc/H05G1-60
filingDate 2009-06-26-04:00^^<http://www.w3.org/2001/XMLSchema#date>
inventor http://rdf.ncbi.nlm.nih.gov/pubchem/patentinventor/MD5_4116f42455a5b40a32b8bd43b70a797f
http://rdf.ncbi.nlm.nih.gov/pubchem/patentinventor/MD5_aa05fdbccb45e4c57260c7390124d3a4
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publicationDate 2010-03-16-04:00^^<http://www.w3.org/2001/XMLSchema#date>
publicationNumber TW-201012303-A
titleOfInvention X-ray inspecting device and method for inspecting X ray
abstract An x-ray inspecting device capable of inspecting the predetermined inspecting area of an object to be inspected is provided herein. The x-ray inspecting device (100) comprises: a x-ray source of scan-type (10) that inputs x ray; a driving part of x-ray inspector (22) that is provided with a plurality of x-ray inspectors (23) and capable of driving the plurality of x-ray inspectors independently; an image pickup controlling mechanism (30) for controlling the pickup of image data that is from the driving part of x-ray inspector (22) and the x-ray inspector (23). Concerning each x-ray inspector, the x-ray source of scan-type (10) radiates x ray as the focal position of the x-ray source is moved to each starting position of the x-ray radiation, and the starting position of the x-ray radiation is set so that the x ray penetrates a plurality of predetermined inspecting areas of the object to be inspected (20) and emits into each x-ray inspector (23). The image pickup of the x-ray inspectors (23) and the movement of the other x-ray inspectors (23) that is not doing the pickup are in parallel and alternatively executed. The image pickup controlling mechanism (30) gets the image data that is inspected by the x-ray inspector (23), and an algorithmic part (70) reforms the images that are in inspection area according to such image data.
isCitedBy http://rdf.ncbi.nlm.nih.gov/pubchem/patent/TW-I479166-B
http://rdf.ncbi.nlm.nih.gov/pubchem/patent/CN-103635148-A
http://rdf.ncbi.nlm.nih.gov/pubchem/patent/US-9282932-B2
http://rdf.ncbi.nlm.nih.gov/pubchem/patent/CN-103635148-B
http://rdf.ncbi.nlm.nih.gov/pubchem/patent/US-8644450-B2
http://rdf.ncbi.nlm.nih.gov/pubchem/patent/TW-I594266-B
http://rdf.ncbi.nlm.nih.gov/pubchem/patent/TW-I480912-B
http://rdf.ncbi.nlm.nih.gov/pubchem/patent/TW-I586221-B
http://rdf.ncbi.nlm.nih.gov/pubchem/patent/TW-I483282-B
priorityDate 2008-09-10-04:00^^<http://www.w3.org/2001/XMLSchema#date>
type http://data.epo.org/linked-data/def/patent/Publication

Incoming Links

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Total number of triples: 27.