Predicate |
Object |
assignee |
http://rdf.ncbi.nlm.nih.gov/pubchem/patentassignee/MD5_57341227c065dbddd1d3cf801bbaa86a |
classificationIPCInventive |
http://rdf.ncbi.nlm.nih.gov/pubchem/patentipc/G01N1-28 |
filingDate |
2008-07-30-04:00^^<http://www.w3.org/2001/XMLSchema#date> |
inventor |
http://rdf.ncbi.nlm.nih.gov/pubchem/patentinventor/MD5_80db39bcd8ba77d86c2c05f272e0c214 http://rdf.ncbi.nlm.nih.gov/pubchem/patentinventor/MD5_ada3938eb629184441f2f8e7be7a1210 |
publicationDate |
2010-02-01-04:00^^<http://www.w3.org/2001/XMLSchema#date> |
publicationNumber |
TW-201005274-A |
titleOfInvention |
Electron microscopy specimen, method and device for preparation thereof |
abstract |
A preparation method for an electron microscopy specimen is provided, which comprises providing a test specimen comprising a feature to be analyzed, marking the test specimen to identify a region to be thinned comprising the feature, and applying a molten hot-melt adhesive on the region to be thinned, and forming a hot-melt adhesive protection layer after cooling. |
isCitedBy |
http://rdf.ncbi.nlm.nih.gov/pubchem/patent/TW-I717980-B http://rdf.ncbi.nlm.nih.gov/pubchem/patent/CN-114486879-A http://rdf.ncbi.nlm.nih.gov/pubchem/patent/CN-110937791-A |
priorityDate |
2008-07-30-04:00^^<http://www.w3.org/2001/XMLSchema#date> |
type |
http://data.epo.org/linked-data/def/patent/Publication |