http://rdf.ncbi.nlm.nih.gov/pubchem/patent/TW-201005274-A

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assignee http://rdf.ncbi.nlm.nih.gov/pubchem/patentassignee/MD5_57341227c065dbddd1d3cf801bbaa86a
classificationIPCInventive http://rdf.ncbi.nlm.nih.gov/pubchem/patentipc/G01N1-28
filingDate 2008-07-30-04:00^^<http://www.w3.org/2001/XMLSchema#date>
inventor http://rdf.ncbi.nlm.nih.gov/pubchem/patentinventor/MD5_80db39bcd8ba77d86c2c05f272e0c214
http://rdf.ncbi.nlm.nih.gov/pubchem/patentinventor/MD5_ada3938eb629184441f2f8e7be7a1210
publicationDate 2010-02-01-04:00^^<http://www.w3.org/2001/XMLSchema#date>
publicationNumber TW-201005274-A
titleOfInvention Electron microscopy specimen, method and device for preparation thereof
abstract A preparation method for an electron microscopy specimen is provided, which comprises providing a test specimen comprising a feature to be analyzed, marking the test specimen to identify a region to be thinned comprising the feature, and applying a molten hot-melt adhesive on the region to be thinned, and forming a hot-melt adhesive protection layer after cooling.
isCitedBy http://rdf.ncbi.nlm.nih.gov/pubchem/patent/TW-I717980-B
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http://rdf.ncbi.nlm.nih.gov/pubchem/patent/CN-110937791-A
priorityDate 2008-07-30-04:00^^<http://www.w3.org/2001/XMLSchema#date>
type http://data.epo.org/linked-data/def/patent/Publication

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Total number of triples: 22.