http://rdf.ncbi.nlm.nih.gov/pubchem/patent/TW-201000922-A
Outgoing Links
| Predicate | Object |
|---|---|
| assignee | http://rdf.ncbi.nlm.nih.gov/pubchem/patentassignee/MD5_3c754156d9ab873a2efe5a3990dbf627 |
| classificationCPCAdditional | http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/G09G3-3655 http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/G09G2310-0205 http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/G09G2300-0426 |
| classificationCPCInventive | http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/G09G3-006 |
| classificationIPCInventive | http://rdf.ncbi.nlm.nih.gov/pubchem/patentipc/G01R31-28 http://rdf.ncbi.nlm.nih.gov/pubchem/patentipc/G01R31-02 |
| filingDate | 2008-06-24-04:00^^<http://www.w3.org/2001/XMLSchema#date> |
| inventor | http://rdf.ncbi.nlm.nih.gov/pubchem/patentinventor/MD5_ab831587275b0d642fb5b693ec7efc7b http://rdf.ncbi.nlm.nih.gov/pubchem/patentinventor/MD5_8b52e024750b701c19b9299d6c7b7bf2 http://rdf.ncbi.nlm.nih.gov/pubchem/patentinventor/MD5_bc844a6529370cbb0d5f5219527659b8 |
| publicationDate | 2010-01-01-04:00^^<http://www.w3.org/2001/XMLSchema#date> |
| publicationNumber | TW-201000922-A |
| titleOfInvention | Liquid crystal display device having test architecture and related test method |
| abstract | An LCD device having test architecture includes a plurality of data lines, a plurality of gate lines, a plurality of common lines, and a plurality of rows of pixel units. The odd and even common lines are utilized for furnishing a first common voltage and a second common voltage, respectively. The odd and even rows of pixel units are coupled to corresponding odd and even common lines, respectively. Furthermore, disclosed is a test method for detecting defects of the LCD device. The test method includes enabling all the gate lines and furnishing a first test voltage to a corresponding data line during a first interval, disabling even gate lines and furnishing a second text voltage to the corresponding data line during a second interval, and switching the second common voltage from a first common test voltage to a second common test voltage during a third interval. |
| priorityDate | 2008-06-24-04:00^^<http://www.w3.org/2001/XMLSchema#date> |
| type | http://data.epo.org/linked-data/def/patent/Publication |
Incoming Links
Total number of triples: 26.