http://rdf.ncbi.nlm.nih.gov/pubchem/patent/TW-200936281-A
Outgoing Links
| Predicate | Object |
|---|---|
| assignee | http://rdf.ncbi.nlm.nih.gov/pubchem/patentassignee/MD5_bd5aab07e1173d0b9ff88e8149f660e5 |
| classificationCPCInventive | http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/C23C30-005 http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/C23C14-0641 |
| classificationIPCInventive | http://rdf.ncbi.nlm.nih.gov/pubchem/patentipc/C23C14-06 http://rdf.ncbi.nlm.nih.gov/pubchem/patentipc/B23C5-00 |
| filingDate | 2008-12-12-04:00^^<http://www.w3.org/2001/XMLSchema#date> |
| inventor | http://rdf.ncbi.nlm.nih.gov/pubchem/patentinventor/MD5_95af8acce3d686090554f92cde6a41ee http://rdf.ncbi.nlm.nih.gov/pubchem/patentinventor/MD5_211e51e68663bd2a5a70fc7236983599 http://rdf.ncbi.nlm.nih.gov/pubchem/patentinventor/MD5_77900770ffc44dd2bbe761d4860cc052 |
| publicationDate | 2009-09-01-04:00^^<http://www.w3.org/2001/XMLSchema#date> |
| publicationNumber | TW-200936281-A |
| titleOfInvention | Hard film for cutting tool |
| abstract | A hard film is provided having excellent abrasion resistance in cutting high hardness quenched steel. There is provided a hard film for a cutting tool that is to be formed on a base material, wherein the hard film has a multilayered film layer formed by alternately layering two or more layers each of a first film layer and a second film layer; the first film layer is a film layer that contains at least Al and Cr as metal components, N as a non-metal component, and unavoidable impurities; the second film layer is a film layer that contains at least Ti and Si as metal and semimetal components, N as a non-metal component, and unavoidable impurities; the thickness of each of the first film layers and the second film layers is set to 1 nm or more and 20 nm or less; and the second film layer has a mixed structure of an amorphous part and granular micro crystals having an average particle diameter of 1 nm or more and 20 nm or less, wherein 10 or more micro crystals of the second film layer penetrate into the adjacent first film layer to a depth of 10% or more of the thickness of the first film layer in an area of 1 μm 1 μm when the multilayered film layer is observed using a cross section TEM method. |
| priorityDate | 2008-01-31-04:00^^<http://www.w3.org/2001/XMLSchema#date> |
| type | http://data.epo.org/linked-data/def/patent/Publication |
Incoming Links
Total number of triples: 28.