http://rdf.ncbi.nlm.nih.gov/pubchem/patent/TW-200931558-A

Outgoing Links

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classificationCPCInventive http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/H01L21-6773
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http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/H01L21-67271
http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/H01L21-67288
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classificationIPCInventive http://rdf.ncbi.nlm.nih.gov/pubchem/patentipc/H01L21-683
http://rdf.ncbi.nlm.nih.gov/pubchem/patentipc/H01L21-66
filingDate 2009-01-05-04:00^^<http://www.w3.org/2001/XMLSchema#date>
inventor http://rdf.ncbi.nlm.nih.gov/pubchem/patentinventor/MD5_7143e9a68726da6f76ec1b9ddeb44bf8
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publicationDate 2009-07-16-04:00^^<http://www.w3.org/2001/XMLSchema#date>
publicationNumber TW-200931558-A
titleOfInvention Apparatus for inspecting semiconductor chip and method thereof
abstract Disclosed is an apparatus for inspecting semiconductor chip and a method thereof, and more particularly, to apparatus for inspecting semiconductor chip capable of inspecting appearance of semiconductor chips, and a method thereof. The apparatus for inspecting semiconductor chip includes a loading unit for loading a waffle pack loaded with a plurality of semiconductor chips; a vision inspection unit for receiving the waffle pack from the loading unit, and inspecting appearance of the semiconductor chips loaded in the waffle pack; a chip exchange unit for exchanging defective semiconductor chips inspected by the vision inspection unit into normal semiconductor chips; and an unloading unit for unloading the waffle pack received from the chip exchange unit.
isCitedBy http://rdf.ncbi.nlm.nih.gov/pubchem/patent/CN-108155112-A
http://rdf.ncbi.nlm.nih.gov/pubchem/patent/CN-108155112-B
http://rdf.ncbi.nlm.nih.gov/pubchem/patent/TW-I570823-B
http://rdf.ncbi.nlm.nih.gov/pubchem/patent/TW-I420120-B
priorityDate 2008-01-03-04:00^^<http://www.w3.org/2001/XMLSchema#date>
type http://data.epo.org/linked-data/def/patent/Publication

Incoming Links

Predicate Subject
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Total number of triples: 23.