http://rdf.ncbi.nlm.nih.gov/pubchem/patent/TW-200809968-A

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classificationIPCInventive http://rdf.ncbi.nlm.nih.gov/pubchem/patentipc/H01L21-31
filingDate 2007-08-07-04:00^^<http://www.w3.org/2001/XMLSchema#date>
inventor http://rdf.ncbi.nlm.nih.gov/pubchem/patentinventor/MD5_2045fa4058590ec64369fe611e2a43d0
publicationDate 2008-02-16-04:00^^<http://www.w3.org/2001/XMLSchema#date>
publicationNumber TW-200809968-A
titleOfInvention Apparatus and method for manufacturing semiconductor
abstract The purpose of the present invention is to prevent the increase of a dielectric constant of a low-k film. The present invention comprises: HMDSO gas-supplying pipe 1021; Si(CH<3>)<3>OCH3 gas-supplying pipe 1022; CH3OH gas-supplying pipe 1023; NF3 gas-supplying pipe 1024; N2 gas-supplying pipe 1025; He gas-supplying pipe 1026; Ar gas-supplying pipe 1027; O2 gas-supplying pipe 1028; N2O gas-supplying pipe 1029; valve 1032 and mass flow meter 1031 connected to each supplying pipe 1021~1029; a pair of upper electrode 1061 and bottom electrode 1062; 13.56MHz oscillator 1063 and 380 kHz oscillator 1064 connected to each electrode 1061, 1062; aluminum plate 1065 installed above the plasma-processing chamber; aluminum oxide insulator 1066 installed near the upper electrode 1061; the gas-exhaust valve 1014 to exhaust the gas in the plasma-processing chamber; and gas-exhaust pump 1015 connected to the gas-exhaust valve 1014.to prevent the increase of a dielectric constant of a low-k film
priorityDate 2006-08-11-04:00^^<http://www.w3.org/2001/XMLSchema#date>
type http://data.epo.org/linked-data/def/patent/Publication

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