| Predicate |
Object |
| assignee |
http://rdf.ncbi.nlm.nih.gov/pubchem/patentassignee/MD5_0e433c1625fc509a087c912b440da84b |
| classificationCPCInventive |
http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/G01R31-2891
http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/G01R1-44 |
| classificationIPCInventive |
http://rdf.ncbi.nlm.nih.gov/pubchem/patentipc/G01R31-26
http://rdf.ncbi.nlm.nih.gov/pubchem/patentipc/G01R1-02 |
| filingDate |
2007-05-17-04:00^^<http://www.w3.org/2001/XMLSchema#date> |
| inventor |
http://rdf.ncbi.nlm.nih.gov/pubchem/patentinventor/MD5_6a296c414f335316ed3190a25f07e79a
http://rdf.ncbi.nlm.nih.gov/pubchem/patentinventor/MD5_c67adaafe6ac7a30a327d9d09ff1901e
http://rdf.ncbi.nlm.nih.gov/pubchem/patentinventor/MD5_5dbbf5e5faf6a7036557ecedeb0c01fc
http://rdf.ncbi.nlm.nih.gov/pubchem/patentinventor/MD5_5a3a7d1a0ab865f42a86780efe92c543 |
| publicationDate |
2008-02-01-04:00^^<http://www.w3.org/2001/XMLSchema#date> |
| publicationNumber |
TW-200807000-A |
| titleOfInvention |
Probe card and temperature stabilizer for testing semiconductor devices |
| abstract |
One aspect of the invention provides an apparatus that includes a probe card (105) having probe needles (120) associated therewith. A temperature stabilizer element (135) is couplable to the probe card. The temperature stabilizer is configured to either raise or lower a temperature of the probe needles to reduce movement of the probe needles. |
| isCitedBy |
http://rdf.ncbi.nlm.nih.gov/pubchem/patent/CN-116295933-A
http://rdf.ncbi.nlm.nih.gov/pubchem/patent/CN-116295933-B
http://rdf.ncbi.nlm.nih.gov/pubchem/patent/TW-I704354-B |
| priorityDate |
2006-05-17-04:00^^<http://www.w3.org/2001/XMLSchema#date> |
| type |
http://data.epo.org/linked-data/def/patent/Publication |