http://rdf.ncbi.nlm.nih.gov/pubchem/patent/TW-200636916-A

Outgoing Links

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assignee http://rdf.ncbi.nlm.nih.gov/pubchem/patentassignee/MD5_c5520dd38cc403678d9f91e0b0ee95fb
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classificationCPCInventive http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/H01L23-52
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classificationIPCInventive http://rdf.ncbi.nlm.nih.gov/pubchem/patentipc/H01L21-768
http://rdf.ncbi.nlm.nih.gov/pubchem/patentipc/H01L21-3205
filingDate 2006-03-02-04:00^^<http://www.w3.org/2001/XMLSchema#date>
inventor http://rdf.ncbi.nlm.nih.gov/pubchem/patentinventor/MD5_29215823fc9a6502911de7cd1aec596c
publicationDate 2006-10-16-04:00^^<http://www.w3.org/2001/XMLSchema#date>
publicationNumber TW-200636916-A
titleOfInvention Semiconductor device and its manufacturing method thereof
abstract The present invention provides a semiconductor device having a copper wiring with high electromigration resistance. Disclosed is a semiconductor device having a wiring layer which is formed by such a process wherein a groove or pore is formed in an insulating film formed on a substrate; a barrier layer is then formed on the substrate; a copper seed layer is formed on the barrier layer; a copper plating layer is formed by electrolytic plating using the copper seed layer, and then by removing the copper plating layer and the copper seed layer on the surface. The copper seed layer is composed of a plurality of layers including a small grain layer and a large grain layer having different crystal grain sizes, and the small grain layer is in contact with the barrier layer.
priorityDate 2005-03-02-04:00^^<http://www.w3.org/2001/XMLSchema#date>
type http://data.epo.org/linked-data/def/patent/Publication

Incoming Links

Predicate Subject
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Total number of triples: 22.