http://rdf.ncbi.nlm.nih.gov/pubchem/patent/TW-200415855-A
Outgoing Links
| Predicate | Object |
|---|---|
| assignee | http://rdf.ncbi.nlm.nih.gov/pubchem/patentassignee/MD5_3873abaff397acbfffa1595a12cfef41 |
| classificationCPCAdditional | http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/H03M1-66 http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/H03M1-12 |
| classificationCPCInventive | http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/G01R31-3167 http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/G01R29-26 http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/H03M1-1085 |
| classificationIPCAdditional | http://rdf.ncbi.nlm.nih.gov/pubchem/patentipc/H03M1-66 http://rdf.ncbi.nlm.nih.gov/pubchem/patentipc/H03M1-12 |
| classificationIPCInventive | http://rdf.ncbi.nlm.nih.gov/pubchem/patentipc/G01R31-3167 http://rdf.ncbi.nlm.nih.gov/pubchem/patentipc/G01R29-26 http://rdf.ncbi.nlm.nih.gov/pubchem/patentipc/H03M1-10 |
| filingDate | 2004-02-13-04:00^^<http://www.w3.org/2001/XMLSchema#date> |
| inventor | http://rdf.ncbi.nlm.nih.gov/pubchem/patentinventor/MD5_13241d747494a56a0ce00c4853768006 http://rdf.ncbi.nlm.nih.gov/pubchem/patentinventor/MD5_8f3ff0bef44ce5b63975a819492181e7 |
| publicationDate | 2004-08-16-04:00^^<http://www.w3.org/2001/XMLSchema#date> |
| publicationNumber | TW-200415855-A |
| titleOfInvention | Method and apparatus for use in DSP-based testing |
| abstract | A system and apparatus for use in deriving test parameters associated to a device in a DSP-based mixed-signal system are provided. A test signal is received. A signal derived from the test signal is sampled to generate a plurality of sampled signals formed of time interleaved samples of the signal derived from the test signal. Each sampled signal is processed independently to derive a respective test parameter associated to a given device in the DSP-based mixed-signal system. The test parameters associated to the plurality of sampled signals are then combined to derive a combined test parameter. By time-interleaving the sampling of the signals, the measurement variance of the test parameter may be improved. Alternatively, the signal derived from the test signal is sampled to generate a first signal and a second signal formed of samples taken at substantially the same time. A processing unit processes the first signal and the second signal to derive a test parameter associated to a given device in the DSP-based mixed-signal system. The simultaneous sampling of the signal allows a reduction in bias error from the measured test parameter. |
| isCitedBy | http://rdf.ncbi.nlm.nih.gov/pubchem/patent/TW-I725244-B |
| priorityDate | 2003-02-13-04:00^^<http://www.w3.org/2001/XMLSchema#date> |
| type | http://data.epo.org/linked-data/def/patent/Publication |
Incoming Links
Total number of triples: 29.