| Predicate |
Object |
| assignee |
http://rdf.ncbi.nlm.nih.gov/pubchem/patentassignee/MD5_029c0345e47b53b4e59a3eb1926c2510 |
| classificationCPCAdditional |
http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/Y10T436-144444
http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/Y10T436-14
http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/Y10T436-11 |
| classificationCPCInventive |
http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/G01N27-3273 |
| classificationIPCInventive |
http://rdf.ncbi.nlm.nih.gov/pubchem/patentipc/G01N27-26
http://rdf.ncbi.nlm.nih.gov/pubchem/patentipc/G01N33-487 |
| filingDate |
2002-12-31-04:00^^<http://www.w3.org/2001/XMLSchema#date> |
| inventor |
http://rdf.ncbi.nlm.nih.gov/pubchem/patentinventor/MD5_5499fcd61069129c01272ea78d9dd1c4
http://rdf.ncbi.nlm.nih.gov/pubchem/patentinventor/MD5_470ffe52416c9467798bd55dfc35959b |
| publicationDate |
2004-07-01-04:00^^<http://www.w3.org/2001/XMLSchema#date> |
| publicationNumber |
TW-200411173-A |
| titleOfInvention |
Chip with measuring reliability and a method thereof |
| abstract |
A chip with measuring reliability and a method thereof are provided. The present invention connects a resistor having a resistance equal to or a little more than a maximum resistance of the chip itself to the resistor Rs of the chip in series so as to compensate the resistance differences among chips. A ratio of noise to signal (N/S) is thus decreased. A measuring reliability of the chip is improved. |
| priorityDate |
2002-12-31-04:00^^<http://www.w3.org/2001/XMLSchema#date> |
| type |
http://data.epo.org/linked-data/def/patent/Publication |