| Predicate |
Object |
| assignee |
http://rdf.ncbi.nlm.nih.gov/pubchem/patentassignee/MD5_ab19f1210666e5d5ee77c5fa00bd0dd9 |
| classificationIPCInventive |
http://rdf.ncbi.nlm.nih.gov/pubchem/patentipc/G01R31-26 |
| filingDate |
1978-11-22-04:00^^<http://www.w3.org/2001/XMLSchema#date> |
| grantDate |
1982-08-07-04:00^^<http://www.w3.org/2001/XMLSchema#date> |
| inventor |
http://rdf.ncbi.nlm.nih.gov/pubchem/patentinventor/MD5_22a0d19bc914fd7c26662272046e1245
http://rdf.ncbi.nlm.nih.gov/pubchem/patentinventor/MD5_b923099b5b6ffcb9db47c70001c0f00b
http://rdf.ncbi.nlm.nih.gov/pubchem/patentinventor/MD5_ff9c9b83a24a12e9b44ac9fc0b9cd514
http://rdf.ncbi.nlm.nih.gov/pubchem/patentinventor/MD5_687c35bc52d9e19e59a38dc68c8651a8
http://rdf.ncbi.nlm.nih.gov/pubchem/patentinventor/MD5_4782fde3c70c0d95f695df67b6ae2a0f
http://rdf.ncbi.nlm.nih.gov/pubchem/patentinventor/MD5_1ffcc5bdc0a1d8ecb90249767b5845bf
http://rdf.ncbi.nlm.nih.gov/pubchem/patentinventor/MD5_cd71688299fa0a646e786fb5ebe213dc |
| publicationDate |
1982-08-07-04:00^^<http://www.w3.org/2001/XMLSchema#date> |
| publicationNumber |
SU-949554-A1 |
| titleOfInvention |
Method of non-destructive determination of anode current build-up rate permissible for the thyristor |
| priorityDate |
1978-11-22-04:00^^<http://www.w3.org/2001/XMLSchema#date> |
| type |
http://data.epo.org/linked-data/def/patent/Publication |