http://rdf.ncbi.nlm.nih.gov/pubchem/patent/SU-822630-A1
Outgoing Links
| Predicate | Object |
|---|---|
| assignee | http://rdf.ncbi.nlm.nih.gov/pubchem/patentassignee/MD5_b9dafd454bd351144c258f8c842f914d |
| classificationIPCInventive | http://rdf.ncbi.nlm.nih.gov/pubchem/patentipc/G01N21-41 |
| filingDate | 1979-07-09-04:00^^<http://www.w3.org/2001/XMLSchema#date> |
| grantDate | 1986-08-30-04:00^^<http://www.w3.org/2001/XMLSchema#date> |
| inventor | http://rdf.ncbi.nlm.nih.gov/pubchem/patentinventor/MD5_1b5480a57eeef40c657b0dd0845d45e4 |
| publicationDate | 1986-08-30-04:00^^<http://www.w3.org/2001/XMLSchema#date> |
| publicationNumber | SU-822630-A1 |
| titleOfInvention | Method of determining refraction in overground layer |
| abstract | THE METHOD FOR DETERMINING THE REFRACTION IN THE GROUND LAYER Contains in that the direction of the normal of the FLAT wave from the light source relative to the plane of the horizon is fixed at the receiving point and at the emission point, which differs from the fact that, in order to improve the determination accuracy, the direction of the normal of a plane wave from the light source, undistorted by refraction with respect to the plane of the horizon and relative to the zero point of the goniometric instrument, and then the direction normal normal distorted by refraction is fixed a plane wave, and the fixation with respect to the horizontal plane is stored unchanged, and the difference samples goniometric instrument is judged complete on the magnitude of the angle of refraction. |
| priorityDate | 1979-07-09-04:00^^<http://www.w3.org/2001/XMLSchema#date> |
| type | http://data.epo.org/linked-data/def/patent/Publication |
Incoming Links
| Predicate | Subject |
|---|---|
| isDiscussedBy | http://rdf.ncbi.nlm.nih.gov/pubchem/compound/CID26937 http://rdf.ncbi.nlm.nih.gov/pubchem/substance/SID419501002 |
Total number of triples: 13.