http://rdf.ncbi.nlm.nih.gov/pubchem/patent/SU-1389606-A1

Outgoing Links

Predicate Object
assignee http://rdf.ncbi.nlm.nih.gov/pubchem/patentassignee/MD5_8b9a40e04216390759c502a5eeb38ab6
classificationIPCInventive http://rdf.ncbi.nlm.nih.gov/pubchem/patentipc/G01R31-26
http://rdf.ncbi.nlm.nih.gov/pubchem/patentipc/H01L21-66
filingDate 1986-05-19-04:00^^<http://www.w3.org/2001/XMLSchema#date>
grantDate 1989-10-23-04:00^^<http://www.w3.org/2001/XMLSchema#date>
inventor http://rdf.ncbi.nlm.nih.gov/pubchem/patentinventor/MD5_0be30efa7ee7dd49c2a6da3a8452311b
http://rdf.ncbi.nlm.nih.gov/pubchem/patentinventor/MD5_4c93231e9554f74764e2f230b856f901
http://rdf.ncbi.nlm.nih.gov/pubchem/patentinventor/MD5_25633424ba3f1ce049ee50753d4ca98b
publicationDate 1989-10-23-04:00^^<http://www.w3.org/2001/XMLSchema#date>
publicationNumber SU-1389606-A1
titleOfInvention Method of determining the capacitance of material with wide inhibition zone in heterojunctions and mis-structures
abstract The invention relates to semiconductor technology and can be used to control the parameters of semiconductor structures during their manufacture, as well as in the process of manufacturing semiconductor devices based on them. The aim of the invention is to expand the functional possibilities and improve the accuracy of capacitance measurements. According to the invention, the sample under study is illuminated with intensity modulated light absorbed only in a material with a smaller band gap. At two different values of the capacitive load, connected in series with the sample under study, the dependence of the variable component of the photoresponse on the modulation frequency is measured. The obtained dependences determine the value of photo responses at that modulation frequency, a further increase of which does not change the size of photo responses. The capacitance of a material with a larger band gap is calculated from the values of photo responses that do not depend on a further increase in the modulation frequency of the radiation and on the corresponding values of capacitive loads. 2 Il. h oh. 00
priorityDate 1986-05-19-04:00^^<http://www.w3.org/2001/XMLSchema#date>
type http://data.epo.org/linked-data/def/patent/Publication

Incoming Links

Predicate Subject
isDiscussedBy http://rdf.ncbi.nlm.nih.gov/pubchem/compound/CID71586773
http://rdf.ncbi.nlm.nih.gov/pubchem/substance/SID428438116

Total number of triples: 16.