http://rdf.ncbi.nlm.nih.gov/pubchem/patent/SU-1087874-A1
Outgoing Links
Predicate | Object |
---|---|
assignee | http://rdf.ncbi.nlm.nih.gov/pubchem/patentassignee/MD5_9e82da614341cb7c8ccc80f006c3d957 |
classificationIPCInventive | http://rdf.ncbi.nlm.nih.gov/pubchem/patentipc/G01N27-90 |
filingDate | 1983-01-03-04:00^^<http://www.w3.org/2001/XMLSchema#date> |
grantDate | 1984-04-23-04:00^^<http://www.w3.org/2001/XMLSchema#date> |
inventor | http://rdf.ncbi.nlm.nih.gov/pubchem/patentinventor/MD5_41e89af47b300117905e1bb3a663f87c http://rdf.ncbi.nlm.nih.gov/pubchem/patentinventor/MD5_da1ea788b9ce3bf7540617f3c61f0976 |
publicationDate | 1984-04-23-04:00^^<http://www.w3.org/2001/XMLSchema#date> |
publicationNumber | SU-1087874-A1 |
titleOfInvention | Method for producing reference specimen for flaw detection |
abstract | THE METHOD OF MANUFACTURING A CONTROL SAMPLE FOR DEFECTIVE SKI i 5 f "l№r sj, -, f ; ..-, consisting in the fact that voltage concentrators are carried out on the sample plate, nitrating it on. a given depth and a load is applied to obtain cracks, characterized in that, in order to increase the accuracy of cracks, the plate is nitrated in a section with a width equal to a predetermined crack length, passing through sharp-angle samples and located on the opposite side of the plate. |
isCitedBy | http://rdf.ncbi.nlm.nih.gov/pubchem/patent/RU-2616671-C2 |
priorityDate | 1983-01-03-04:00^^<http://www.w3.org/2001/XMLSchema#date> |
type | http://data.epo.org/linked-data/def/patent/Publication |
Incoming Links
Total number of triples: 20.