http://rdf.ncbi.nlm.nih.gov/pubchem/patent/SU-1087874-A1

Outgoing Links

Predicate Object
assignee http://rdf.ncbi.nlm.nih.gov/pubchem/patentassignee/MD5_9e82da614341cb7c8ccc80f006c3d957
classificationIPCInventive http://rdf.ncbi.nlm.nih.gov/pubchem/patentipc/G01N27-90
filingDate 1983-01-03-04:00^^<http://www.w3.org/2001/XMLSchema#date>
grantDate 1984-04-23-04:00^^<http://www.w3.org/2001/XMLSchema#date>
inventor http://rdf.ncbi.nlm.nih.gov/pubchem/patentinventor/MD5_41e89af47b300117905e1bb3a663f87c
http://rdf.ncbi.nlm.nih.gov/pubchem/patentinventor/MD5_da1ea788b9ce3bf7540617f3c61f0976
publicationDate 1984-04-23-04:00^^<http://www.w3.org/2001/XMLSchema#date>
publicationNumber SU-1087874-A1
titleOfInvention Method for producing reference specimen for flaw detection
abstract THE METHOD OF MANUFACTURING A CONTROL SAMPLE FOR DEFECTIVE SKI i 5 f "l№r sj, -, f ; ..-, consisting in the fact that voltage concentrators are carried out on the sample plate, nitrating it on. a given depth and a load is applied to obtain cracks, characterized in that, in order to increase the accuracy of cracks, the plate is nitrated in a section with a width equal to a predetermined crack length, passing through sharp-angle samples and located on the opposite side of the plate.
isCitedBy http://rdf.ncbi.nlm.nih.gov/pubchem/patent/RU-2616671-C2
priorityDate 1983-01-03-04:00^^<http://www.w3.org/2001/XMLSchema#date>
type http://data.epo.org/linked-data/def/patent/Publication

Incoming Links

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Total number of triples: 20.