http://rdf.ncbi.nlm.nih.gov/pubchem/patent/RU-121374-U1
Outgoing Links
| Predicate | Object |
|---|---|
| classificationIPCInventive | http://rdf.ncbi.nlm.nih.gov/pubchem/patentipc/G01R31-26 |
| filingDate | 2012-05-17-04:00^^<http://www.w3.org/2001/XMLSchema#date> |
| grantDate | 2012-10-20-04:00^^<http://www.w3.org/2001/XMLSchema#date> |
| publicationDate | 2012-10-20-04:00^^<http://www.w3.org/2001/XMLSchema#date> |
| publicationNumber | RU-121374-U1 |
| titleOfInvention | DEVICE FOR ACCELERATED CONTROL OF HEAT RESISTANCE OF POWER SEMICONDUCTOR TABLET CONSTRUCTION DEVICES |
| abstract | The utility model relates to the field of electrical engineering, namely to power semiconductor converters and specifically to power semiconductor devices (SPP) - thyristors and diodes of tablet design. NGN, which are the main functional elements of converters, mainly determine their reliability. The technical result of the proposed solution is to increase the accuracy of the control results of power semiconductor devices with respect to the thermal resistance parameter and significantly reduce the control time, which ensures continuous monitoring of products and eliminates the commissioning of power semiconductor devices with thermal resistance that do not meet the technical requirements. The inventive device for accelerated thermal resistance control of power semiconductor devices of tablet design, in which there is a power heating current unit and a measuring unit, the test device (IP) is placed in the clamping assembly, in which a water-cooled chiller, IP, 1st power copper bus, tablet design diode with known parameters, calibrated by a thermosensitive parameter (TCH), 2nd power copper bus, thermal insulator, while heat th SP resistance defined by R tjc calculated for this measured deviation connection assembly TCHP with thermal parameters of the device through the asymmetry coefficient:n n n where R is the thermal resistance of the IP in the assembly; n is the asymmetry coefficient, reflecting the difference in thermal resistance of the tested device from the anode side and from the cathode side. |
| isCitedBy | http://rdf.ncbi.nlm.nih.gov/pubchem/patent/RU-2529761-C1 |
| priorityDate | 2012-05-17-04:00^^<http://www.w3.org/2001/XMLSchema#date> |
| type | http://data.epo.org/linked-data/def/patent/Publication |
Incoming Links
Total number of triples: 14.