Predicate |
Object |
assignee |
http://rdf.ncbi.nlm.nih.gov/pubchem/patentassignee/MD5_4d7efdc1ce2d7474e9eff812bc73ee56 |
classificationCPCInventive |
http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/G01N27-64 http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/G01N27-62 http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/G01N27-622 |
classificationIPCInventive |
http://rdf.ncbi.nlm.nih.gov/pubchem/patentipc/G01N27-64 |
filingDate |
2002-01-04-04:00^^<http://www.w3.org/2001/XMLSchema#date> |
inventor |
http://rdf.ncbi.nlm.nih.gov/pubchem/patentinventor/MD5_774a649c8162d70d7de4339e7c2d74c9 http://rdf.ncbi.nlm.nih.gov/pubchem/patentinventor/MD5_ab75a4099978119175a1829a6c8c20ba http://rdf.ncbi.nlm.nih.gov/pubchem/patentinventor/MD5_17e50766b544d0dfb1679c5f7e687208 http://rdf.ncbi.nlm.nih.gov/pubchem/patentinventor/MD5_1db027da074f156df72e80a43cd5685c |
publicationDate |
2009-10-30-04:00^^<http://www.w3.org/2001/XMLSchema#date> |
publicationNumber |
MY-139604-A |
titleOfInvention |
A method for measuring the concentration of impurities in helium by ion mobility spectrometry. |
abstract |
A METHOD FOR THE QUANTITATIVE ANALYSIS OF THE CONCENTRATION OF IMPURITIES IN HELIUM BY MEANS OF ION MOBILITY SPECTROMETRY IS DESCRIBED, WHICH CONSISTS IN USING PURIFIED ARGON TOGETHER WITH THE HELIUM WHICH HAS TO BE ANALYZED FOR FORMING THE SAMPLE, OR PURE ARGON AS COUNTERFLOW GAS IN THE SEPARATION ZONE OF THE INSTRUMENT, OR FINALLY HELIUM-PURIFIED ARGON MIXTURES BOTH FOR THE SAMPLE GAS AND FOR THE COUNTERFLOW GAS. |
priorityDate |
2001-01-08-04:00^^<http://www.w3.org/2001/XMLSchema#date> |
type |
http://data.epo.org/linked-data/def/patent/Publication |