http://rdf.ncbi.nlm.nih.gov/pubchem/patent/KR-880008023-A
Outgoing Links
Predicate | Object |
---|---|
classificationCPCAdditional | http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/G01N2291-02827 http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/G01N2291-02881 http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/G01N2291-0289 |
classificationCPCInventive | http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/G01N29-00 http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/G01N29-07 |
classificationIPCInventive | http://rdf.ncbi.nlm.nih.gov/pubchem/patentipc/G01N29-00 http://rdf.ncbi.nlm.nih.gov/pubchem/patentipc/G01N29-07 |
filingDate | 1987-12-24-04:00^^<http://www.w3.org/2001/XMLSchema#date> |
publicationDate | 1988-08-30-04:00^^<http://www.w3.org/2001/XMLSchema#date> |
publicationNumber | KR-880008023-A |
titleOfInvention | Grid defect measurement method in semiconductor |
abstract | No content. |
priorityDate | 1986-12-26-04:00^^<http://www.w3.org/2001/XMLSchema#date> |
type | http://data.epo.org/linked-data/def/patent/Publication |
Incoming Links
Total number of triples: 18.