| abstract |
Methods, systems, apparatus and machine readable media are disclosed in some examples for compensating for charge loss effects. In some examples, the charge loss may be estimated by a charge loss monitor for a particular unit of the NAND device and utilized to select a charge loss compensation scheme. The charge loss can be estimated by the charge loss estimation process by determining a reference read voltage and counting the bit counts due to reads at that reference read voltage. The number of bits returned can be used to select a specific charge loss compensation scheme. |