| abstract |
A crystal structure compound A having a diffraction peak in the range of the incidence angle (2θ) observed by X-ray (Cu-Kα ray) diffraction measurement specified in the following compositional formula (2) and specified in the following (A) to (K). (In x Ga y Al z ) 2 O 3 ····(2) (In formula (2), 0.47 ≤ x ≤ 0.53, 0.17 ≤ y ≤ 0.43, 0.07 ≤ z ≤ 0.33, and x + y + z = 1.) 31° to 34°...(A), 36° to 39°...(B), 30° to 32°...(C), 51° to 53°...(D), 53° ∼ 56°...(E), 62°∼ 66°...(F), 9°∼ 11°...(G), 19°∼ 21°...(H), 42°∼ 45 °···(I), 8°-10°...(J), 17°-19°...(K) |