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filingDate 2019-11-01-04:00^^<http://www.w3.org/2001/XMLSchema#date>
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publicationDate 2020-08-24-04:00^^<http://www.w3.org/2001/XMLSchema#date>
publicationNumber KR-20200099461-A
titleOfInvention Thin film sample piece creating method and charged particle beam device
abstract (Problem) A method for preparing a thin film sample piece and a charged particle beam device capable of suppressing defects in the thin film sample piece are provided. (Solution means) By processing the sample S by irradiating the focused ion beam FIB2 from the second direction intersecting the normal direction z of the surface of the sample S, the thin film sample piece 1 is prepared. In addition, the process of creating a connection part 3 which is disposed on one side of the thin film sample piece 1 in the thickness direction x and connects the thin film sample piece 1 to the sample S, and the normal direction z The process of rotating the sample S around the circumference, the process of connecting the needle holding the thin-film sample piece 1 to the thin-film sample piece 1, and the connection part 3 from the third direction intersecting the normal direction z ) Is irradiated with a focused ion beam (FIB3) to separate the thin film sample piece 1 from the sample S.
priorityDate 2019-02-14-04:00^^<http://www.w3.org/2001/XMLSchema#date>
type http://data.epo.org/linked-data/def/patent/Publication

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