| Predicate |
Object |
| assignee |
http://rdf.ncbi.nlm.nih.gov/pubchem/patentassignee/MD5_8487464fa6768affe265413ae02be74c |
| classificationCPCAdditional |
http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/G06T2207-10061
http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/G06T2207-30024
http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/G06T2207-20084
http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/G06T2207-20081
http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/G06T2207-30136 |
| classificationCPCInventive |
http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/G01N23-04
http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/G06N3-08
http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/G06T7-0012
http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/G06T7-70
http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/G06N3-045
http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/G06T7-60
http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/G01N21-84
http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/G06T7-0004
http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/G16C20-70
http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/G01N27-62
http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/G06T5-002
http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/G06N3-04 |
| classificationIPCInventive |
http://rdf.ncbi.nlm.nih.gov/pubchem/patentipc/G06N3-08 |
| filingDate |
2018-11-07-04:00^^<http://www.w3.org/2001/XMLSchema#date> |
| inventor |
http://rdf.ncbi.nlm.nih.gov/pubchem/patentinventor/MD5_649e15e70ce204cfe8c7d51201298c7e
http://rdf.ncbi.nlm.nih.gov/pubchem/patentinventor/MD5_8699f610a0c3b2ad9783cf8e570afa6b
http://rdf.ncbi.nlm.nih.gov/pubchem/patentinventor/MD5_fa3b64dfeba9935cf6765ac11ed82098
http://rdf.ncbi.nlm.nih.gov/pubchem/patentinventor/MD5_ca54374639adbed95790907f25d96c83 |
| publicationDate |
2020-05-20-04:00^^<http://www.w3.org/2001/XMLSchema#date> |
| publicationNumber |
KR-20200054380-A |
| titleOfInvention |
An analyzing method for perovskite structure using machine learning |
| abstract |
The present invention relates to a method of analyzing the characteristics of data obtained through a scanning transmission electron microscope (STEM) using a CNN technique, atomic position, especially oxygen octahedral structure to a level of a few picometer units. The method according to the invention comprises: (a) obtaining an atomic image with an atomic structure simulator; (b) training the atomic image in a CNN model; And (c) acquiring an atomic image for a real material using TEM or STEM, and then applying it to the trained CNN model. |
| priorityDate |
2018-11-07-04:00^^<http://www.w3.org/2001/XMLSchema#date> |
| type |
http://data.epo.org/linked-data/def/patent/Publication |