abstract |
The present invention relates to an apparatus for measuring fine dust, and more particularly, to an apparatus for measuring fine dust using SiPM, which makes it possible to more precisely measure density, particle size, and the like with respect to fine dust in the atmosphere. To this end, the present invention is characterized by measuring at least any one or more of the particle size and density of the fine dust by light multiplying the light scattered by the fine dust with a SiPM (Silicon Photo-Multiplier). |