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publicationDate 2019-10-14-04:00^^<http://www.w3.org/2001/XMLSchema#date>
publicationNumber KR-20190116384-A
titleOfInvention Methods for Evaluating Semiconductor Structures
abstract Methods are disclosed for evaluating the quality of a semiconductor structure having a charge trapping layer (CTL), for example, to determine if the semiconductor structure is suitable for use as a radiofrequency device. Embodiments of the evaluation method may include measuring an electrostatic parameter in an initial state and an excited state in which charge carriers are generated.
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