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publicationDate 2018-10-17-04:00^^<http://www.w3.org/2001/XMLSchema#date>
publicationNumber KR-20180113887-A
titleOfInvention Semiconductor device and manufacturing method thereof
abstract In a method for fabricating a semiconductor device by using a gate replacement technique, a gate space is formed which is constituted by portions of the dielectric material from which the semiconductor fin channel layer is exposed. The surfaces of the dielectric material portions are made hydrophobic. A first dielectric layer is formed on the semiconductor fin channel layer, while maintaining the surfaces of the dielectric material portions hydrophobic. The surface of the formed first dielectric layer is hydrophilic. A first conductive layer is formed over the first dielectric layer, while maintaining the surfaces of the dielectric material portions hydrophobic. A second conductive layer is formed over the first conductive layer and on the hydrophobic surfaces of the dielectric material portions to fill the gate space.
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