http://rdf.ncbi.nlm.nih.gov/pubchem/patent/KR-20180088878-A

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filingDate 2016-11-30-04:00^^<http://www.w3.org/2001/XMLSchema#date>
inventor http://rdf.ncbi.nlm.nih.gov/pubchem/patentinventor/MD5_263b84d19106f2f7d4af74021b7222d9
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publicationDate 2018-08-07-04:00^^<http://www.w3.org/2001/XMLSchema#date>
publicationNumber KR-20180088878-A
titleOfInvention Method for obtaining a semi-polar nitride layer on a crystalline substrate
abstract The claimed invention relates to a method for obtaining a semi-polar layer (480) of at least one nitride (N), the semi-polar layer being formed on the upper surface of a crystalline layer (410) Ga), indium (In) and aluminum (Al), the method comprising the following steps: starting from the top surface of the crystal layer, at least two opposing inclined facets (330, Etching the plurality of parallel grooves (460) having a crystal orientation {111}, wherein the opposing inclined facets (330, 331) have a crystal orientation {111}; Masking the upper surface of the crystalline layer 410 in such a way that the facets 330 have an unmasked crystal orientation {111}; - epitaxially growing a semi-polar nitride layer (480) from the unmasked facets (330), the etch comprising a crystalline layer (410) and at least one barrier covered by the crystalline layer (410) Layer 420 and the etch is performed in a selective manner relative to the barrier layer 420 in a manner such that the etch is stopped upon contact with the barrier layer 420, ) Is etched.
priorityDate 2015-11-30-04:00^^<http://www.w3.org/2001/XMLSchema#date>
type http://data.epo.org/linked-data/def/patent/Publication

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