Predicate |
Object |
assignee |
http://rdf.ncbi.nlm.nih.gov/pubchem/patentassignee/MD5_781c429e4e20536916ff74dcbe1b5417 |
classificationCPCAdditional |
http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/C04B2235-77 http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/C04B2235-3293 http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/C04B2235-3286 http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/C04B2235-3284 |
classificationCPCInventive |
http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/H01B5-14 http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/H01J37-3491 http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/C23C14-3414 http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/C23C14-3407 http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/C23C14-08 http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/C23C14-086 http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/C04B35-457 |
classificationIPCInventive |
http://rdf.ncbi.nlm.nih.gov/pubchem/patentipc/H01J37-34 http://rdf.ncbi.nlm.nih.gov/pubchem/patentipc/C23C14-34 http://rdf.ncbi.nlm.nih.gov/pubchem/patentipc/C04B35-457 http://rdf.ncbi.nlm.nih.gov/pubchem/patentipc/C23C14-08 |
filingDate |
2017-12-22-04:00^^<http://www.w3.org/2001/XMLSchema#date> |
inventor |
http://rdf.ncbi.nlm.nih.gov/pubchem/patentinventor/MD5_16fd9445b65e5592a0d1c7cd1632017b |
publicationDate |
2018-07-02-04:00^^<http://www.w3.org/2001/XMLSchema#date> |
publicationNumber |
KR-20180073507-A |
titleOfInvention |
Target for forming transparent conductive film, transparent conductive film, method of manufacturing target for forming transparent conductive film and method of manufacturing transparent conductive film |
abstract |
[PROBLEMS] To provide a target for forming a transparent conductive film, a transparent conductive film, a method for manufacturing a target for forming a transparent conductive film, and a method for manufacturing a transparent conductive film which can suppress generation of arcs and particles at the time of sputtering, do. (Sn + Zn) = 7 to 17 at%, Zn / (In + Sn + Zn) = 0.5 to 12 at% And a peak intensity ratio (Sn 3 In 4 O 12 / In 2 O 3 ) of Sn 3 In 4 O 12 crystal phase to an In 2 O 3 crystal phase according to XRD measurement is 0.10 or less and a relative density is 97% or more And is a target for forming a transparent conductive film. |
priorityDate |
2016-12-22-04:00^^<http://www.w3.org/2001/XMLSchema#date> |
type |
http://data.epo.org/linked-data/def/patent/Publication |