http://rdf.ncbi.nlm.nih.gov/pubchem/patent/KR-20170140175-A

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filingDate 2015-04-07-04:00^^<http://www.w3.org/2001/XMLSchema#date>
inventor http://rdf.ncbi.nlm.nih.gov/pubchem/patentinventor/MD5_617e191d772b191bc2f8748828f33ce9
publicationDate 2017-12-20-04:00^^<http://www.w3.org/2001/XMLSchema#date>
publicationNumber KR-20170140175-A
titleOfInvention Semiconductor X-ray detector
abstract An apparatus (100) for detecting X-rays is disclosed, comprising: an X-ray absorbing layer (110) comprising an electrode; A first voltage comparator (301) configured to compare a voltage of the electrode with a first threshold (V1); A second voltage comparator (302) configured to compare the voltage to a second threshold (V2); A counter 320 configured to record the number of X-ray photons absorbed by the X-ray absorption layer 110; And a controller (310). The controller 310 determines the time delay from the time determined by the first voltage comparator 301 that the absolute value of the voltage is equal to the absolute value of the first threshold value V1 or exceeds the absolute value of the first threshold value V1 TD1, &lt; / RTI &gt;TD2); Activating a second voltage comparator (302) during a time delay (TDl, TD2); And if the second voltage comparator 302 determines that the absolute value of the voltage during the time delays TD1 and TD2 is equal to or exceeds the absolute value of the second threshold value V2 , And to cause the number recorded by the counter 320 to increase by one.
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