http://rdf.ncbi.nlm.nih.gov/pubchem/patent/KR-20170136795-A

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filingDate 2016-06-02-04:00^^<http://www.w3.org/2001/XMLSchema#date>
inventor http://rdf.ncbi.nlm.nih.gov/pubchem/patentinventor/MD5_a1f15b3be3f9524342ff1c952b2730bd
publicationDate 2017-12-12-04:00^^<http://www.w3.org/2001/XMLSchema#date>
publicationNumber KR-20170136795-A
titleOfInvention Interface module and apparatus for testing semiconductor devices having the same
abstract An interface module for use in testing electrical characteristics of semiconductor devices is disclosed. The interface module includes an interface board for applying an inspection signal to the semiconductor elements housed in the test tray, a socket guide mounted on the interface board, a plurality of test sockets mounted on the socket guide and connected to the semiconductor elements, And a temperature adjusting member disposed on one side of the socket guide. The temperature regulating member has a first heat radiating member that radiates heat in a direction perpendicular to the interface board. As described above, since the interface module includes a separate temperature control member for releasing the heat of the interface board, the temperature distribution uniformity of the interface board can be improved and the interface board can be maintained at a proper temperature.
isCitedBy http://rdf.ncbi.nlm.nih.gov/pubchem/patent/KR-101999834-B1
http://rdf.ncbi.nlm.nih.gov/pubchem/patent/KR-102518780-B1
http://rdf.ncbi.nlm.nih.gov/pubchem/patent/KR-20190125724-A
http://rdf.ncbi.nlm.nih.gov/pubchem/patent/KR-102065972-B1
http://rdf.ncbi.nlm.nih.gov/pubchem/patent/KR-102176051-B1
priorityDate 2016-06-02-04:00^^<http://www.w3.org/2001/XMLSchema#date>
type http://data.epo.org/linked-data/def/patent/Publication

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Total number of triples: 26.