http://rdf.ncbi.nlm.nih.gov/pubchem/patent/KR-20170019533-A
Outgoing Links
| Predicate | Object |
|---|---|
| assignee | http://rdf.ncbi.nlm.nih.gov/pubchem/patentassignee/MD5_70f555f5586f7b01bacd16087ac91bf3 |
| classificationCPCAdditional | http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/G06T2207-30141 http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/G01N2201-061 http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/G06T2207-10004 http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/G06T2207-10048 http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/G01N2021-8893 |
| classificationCPCInventive | http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/G01N21-956 http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/G01N21-8851 http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/G01N21-958 http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/G06T7-0004 http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/G01B11-022 http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/G01B11-24 |
| classificationIPCInventive | http://rdf.ncbi.nlm.nih.gov/pubchem/patentipc/G01B11-24 http://rdf.ncbi.nlm.nih.gov/pubchem/patentipc/G06T7-00 http://rdf.ncbi.nlm.nih.gov/pubchem/patentipc/G01N21-958 http://rdf.ncbi.nlm.nih.gov/pubchem/patentipc/G01N21-956 http://rdf.ncbi.nlm.nih.gov/pubchem/patentipc/G01B11-02 http://rdf.ncbi.nlm.nih.gov/pubchem/patentipc/G01N21-88 |
| filingDate | 2015-08-11-04:00^^<http://www.w3.org/2001/XMLSchema#date> |
| inventor | http://rdf.ncbi.nlm.nih.gov/pubchem/patentinventor/MD5_3cab091d8702f7ef45abfcaab0aaa9c2 http://rdf.ncbi.nlm.nih.gov/pubchem/patentinventor/MD5_4f3d17977dbea60447dd0fdd1b439f59 http://rdf.ncbi.nlm.nih.gov/pubchem/patentinventor/MD5_1b5bb6617d0f14d59c23996c7e29b90b |
| publicationDate | 2017-02-22-04:00^^<http://www.w3.org/2001/XMLSchema#date> |
| publicationNumber | KR-20170019533-A |
| titleOfInvention | Two dimensional shape inspection apparatus of transparrent conductive pattern and inspecting method using the same |
| abstract | A two-dimensional shape inspection apparatus and a method for inspecting a two-dimensional shape of a transparent conductive pattern designed to easily inspect a line width and a defect of a transparent conductive pattern formed on a transparent substrate all at once by using a surface illumination in an infrared region and an infrared CCD camera . The apparatus for inspecting a two-dimensional shape of a transparent conductive pattern according to the present invention is a device for inspecting the line width of a transparent conductive pattern formed on a transparent substrate and the presence or absence of a defect, An infrared light emitting unit for collectively irradiating the transparent substrate with the surface illumination in the infrared region; An optical processing unit mounted on an upper portion spaced apart from the transparent substrate to receive a transparent conductive pattern image by plane illumination of an infrared region transmitting a transparent conductive pattern formed on the transparent substrate; And an image processor for receiving an output signal from the optical processor and inspecting the transparent conductive pattern image to check the line width of the transparent conductive pattern and whether or not the transparent conductive pattern is defective. |
| priorityDate | 2015-08-11-04:00^^<http://www.w3.org/2001/XMLSchema#date> |
| type | http://data.epo.org/linked-data/def/patent/Publication |
Incoming Links
Total number of triples: 48.