http://rdf.ncbi.nlm.nih.gov/pubchem/patent/KR-20170012168-A

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filingDate 2016-08-16-04:00^^<http://www.w3.org/2001/XMLSchema#date>
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publicationDate 2017-02-02-04:00^^<http://www.w3.org/2001/XMLSchema#date>
publicationNumber KR-20170012168-A
titleOfInvention Method and Apparatus for Measuring 3D Refractive Index Tomograms Using a High-Speed Wavefront Shaper
abstract A high-speed, high-precision three-dimensional refractive index measurement method and apparatus using a wavefront controller is presented. An ultrahigh-speed, high-precision three-dimensional refractive index measurement method using a wavefront controller includes the steps of changing at least one of an irradiation angle and a wavefront pattern of an incident light by using a wavefront shaper and entering the sample; Measuring a two-dimensional optical field passing through the sample according to at least one incident light using an interferometer; And acquiring a three-dimensional refractive index image through the measured information of the two-dimensional optical field.
isCitedBy http://rdf.ncbi.nlm.nih.gov/pubchem/patent/KR-20190050149-A
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