http://rdf.ncbi.nlm.nih.gov/pubchem/patent/KR-20170006807-A

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filingDate 2015-07-09-04:00^^<http://www.w3.org/2001/XMLSchema#date>
inventor http://rdf.ncbi.nlm.nih.gov/pubchem/patentinventor/MD5_a62ebf6ce4a525b0e2fac0638378eca5
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publicationDate 2017-01-18-04:00^^<http://www.w3.org/2001/XMLSchema#date>
publicationNumber KR-20170006807-A
titleOfInvention Component parts of process chamber and yttria deposition method on componet parts using chemical vapor deposition
abstract The present invention relates to a component part of a process chamber and a method for depositing yttria on the same by chemical vapor deposition, and more specifically, to a component part of a process chamber and a method for depositing yttria on the same by chemical vapor deposition which coat yttria on a surface of a component part by chemical vapor deposition to prevent damage to the component part by a corrosive atmosphere in a semiconductor or a display process. The component part of a process chamber is exposed to a process environment under a plasma atmosphere or a corrosive gas atmosphere of a semiconductor or a display process, and comprises at least one among a metallic material, a ceramic material, and an alloy. A precursor which is a reaction source including yttrium and oxide including oxygen are used as reaction gas to deposit or coat a ceramic thin film on a surface or an edge of the component part by chemical vapor deposition to prevent corrosion or erosion of the component part in the process chamber.
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