http://rdf.ncbi.nlm.nih.gov/pubchem/patent/KR-20160091508-A
Outgoing Links
| Predicate | Object |
|---|---|
| assignee | http://rdf.ncbi.nlm.nih.gov/pubchem/patentassignee/MD5_c63bc5ef3ae590b0603de4587961cac3 |
| classificationCPCAdditional | http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/G01R31-31727 |
| classificationCPCInventive | http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/G01R31-31701 http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/G11C29-44 http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/G01R31-2601 |
| classificationIPCInventive | http://rdf.ncbi.nlm.nih.gov/pubchem/patentipc/G01R31-26 |
| filingDate | 2015-01-23-04:00^^<http://www.w3.org/2001/XMLSchema#date> |
| inventor | http://rdf.ncbi.nlm.nih.gov/pubchem/patentinventor/MD5_5f08f2cb22054fb3d96dbdc80ab7b762 http://rdf.ncbi.nlm.nih.gov/pubchem/patentinventor/MD5_362b9f2fd5fe0096b48481acae1283b3 |
| publicationDate | 2016-08-03-04:00^^<http://www.w3.org/2001/XMLSchema#date> |
| publicationNumber | KR-20160091508-A |
| titleOfInvention | Test mode circuit and Semiconductor device including the same |
| abstract | The present invention relates to a test mode circuit and a semiconductor device including the same, and a test mode circuit according to the present invention includes a test mode activation signal generation unit for generating a test mode activation signal in response to a test signal, And a test clock generation unit for generating a plurality of test clocks in response to a control clock, and a test clock generation unit for separating the plurality of test clocks into a control signal input period and a data input period, A test control signal generator for generating test control signals using a clock, and an internal control signal generator for generating control signals for performing a test operation in response to the test control signals. |
| priorityDate | 2015-01-23-04:00^^<http://www.w3.org/2001/XMLSchema#date> |
| type | http://data.epo.org/linked-data/def/patent/Publication |
Incoming Links
Total number of triples: 36.