Predicate |
Object |
assignee |
http://rdf.ncbi.nlm.nih.gov/pubchem/patentassignee/MD5_ed62b7551998e54b35784cdbbb2778d5 |
classificationCPCAdditional |
http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/H01L2924-1436 http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/H01L2924-1438 |
classificationCPCInventive |
http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/H01L21-205 http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/H01L21-324 http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/H01L21-32055 http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/H01L21-02263 http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/H01L21-2018 http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/H01L21-02068 |
classificationIPCInventive |
http://rdf.ncbi.nlm.nih.gov/pubchem/patentipc/H01L21-02 http://rdf.ncbi.nlm.nih.gov/pubchem/patentipc/H01L21-205 http://rdf.ncbi.nlm.nih.gov/pubchem/patentipc/H01L21-20 http://rdf.ncbi.nlm.nih.gov/pubchem/patentipc/H01L21-3205 http://rdf.ncbi.nlm.nih.gov/pubchem/patentipc/H01L21-324 |
filingDate |
2015-11-02-04:00^^<http://www.w3.org/2001/XMLSchema#date> |
inventor |
http://rdf.ncbi.nlm.nih.gov/pubchem/patentinventor/MD5_9c52a4109b4519fe1b8ffb1bb5db9d11 http://rdf.ncbi.nlm.nih.gov/pubchem/patentinventor/MD5_c1be1602f41405a9bc8d104415afcfef http://rdf.ncbi.nlm.nih.gov/pubchem/patentinventor/MD5_59751372cb227f60426b980b438cbd0a http://rdf.ncbi.nlm.nih.gov/pubchem/patentinventor/MD5_fb77047d2cd5b0e0aecf1f209599d24c |
publicationDate |
2016-05-27-04:00^^<http://www.w3.org/2001/XMLSchema#date> |
publicationNumber |
KR-20160059952-A |
titleOfInvention |
Method of manufacturing semiconductor device, substrate processing apparatus, gas supply system, program, three-dimensional flash memory, dynamic random access memory, and semiconductor device |
abstract |
The film quality of the Si film to be formed is improved when the Si film is formed on the substrate where the insulating film is exposed on at least a part of the surface. A first silicon film formed by homoepitaxial growth of monocrystal silicon on a base of monocrystal silicon; a first silicon film formed on the insulating film and having a different crystal structure from the first silicon film; And a second silicon film. |
isCitedBy |
http://rdf.ncbi.nlm.nih.gov/pubchem/patent/US-10529560-B2 http://rdf.ncbi.nlm.nih.gov/pubchem/patent/KR-20180107729-A |
priorityDate |
2014-11-19-04:00^^<http://www.w3.org/2001/XMLSchema#date> |
type |
http://data.epo.org/linked-data/def/patent/Publication |