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filingDate 2013-11-21-04:00^^<http://www.w3.org/2001/XMLSchema#date>
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publicationDate 2015-07-27-04:00^^<http://www.w3.org/2001/XMLSchema#date>
publicationNumber KR-20150086340-A
titleOfInvention Apparatus and methods for detecting defects in vertical memory
abstract Methods and apparatus for investigating a vertical memory stack are disclosed. On the illumination tool, incident light having a first wavelength range is used to detect defects on the surface of the vertical memory stack. On the illumination tool, incident light having a second wavelength range is used to detect defects both on the surface and on the depth of the vertical memory stack. Defects that are detected using the first and second wavelength ranges are used to exclude defects on the surface and to detect defects only in the depth first of the vertical memory stack.
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