http://rdf.ncbi.nlm.nih.gov/pubchem/patent/KR-20140148416-A

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publicationDate 2014-12-31-04:00^^<http://www.w3.org/2001/XMLSchema#date>
publicationNumber KR-20140148416-A
titleOfInvention Methods of measuring a characteristic of a creping adhesive film and methods of modifying the creping adhesive film
abstract A quartz crystal microbalance (QCMD) technique using loss and a quartz crystal microbalance (QCM) that can be used to characterize a creping adhesive film similar to a creping adhesive film formed on a Yankee dryer during a tissue and towel manufacturing process Are described herein. In addition, the exemplary embodiments described herein may utilize these techniques to predict the performance of creping aids used in the formation of creping adhesive films.
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