| Predicate |
Object |
| assignee |
http://rdf.ncbi.nlm.nih.gov/pubchem/patentassignee/MD5_e2c321c5b9b5774498f194d959bdf9df |
| classificationCPCAdditional |
http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/G01R1-0466
http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/G01R1-0458
http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/G01R31-2889
http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/G01R31-2886
http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/G01R1-06722 |
| classificationCPCInventive |
http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/G01R1-067
http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/G01R31-2619
http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/G01R1-0408
http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/G01R1-045
http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/G01R31-26
http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/G01R1-06716
http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/G01R1-06772
http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/G01R1-073
http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/G01R1-0483
http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/G01R1-18 |
| classificationIPCInventive |
http://rdf.ncbi.nlm.nih.gov/pubchem/patentipc/G01R31-26
http://rdf.ncbi.nlm.nih.gov/pubchem/patentipc/G01R1-18
http://rdf.ncbi.nlm.nih.gov/pubchem/patentipc/G01R1-073 |
| filingDate |
2014-05-19-04:00^^<http://www.w3.org/2001/XMLSchema#date> |
| inventor |
http://rdf.ncbi.nlm.nih.gov/pubchem/patentinventor/MD5_5206720a0fb12f93fdac2cdae1cf4511
http://rdf.ncbi.nlm.nih.gov/pubchem/patentinventor/MD5_2d72909d9d8809d9d883fab8663c4a5d
http://rdf.ncbi.nlm.nih.gov/pubchem/patentinventor/MD5_e2b2c0e41184a18ff8bb6c3a70b45f48 |
| publicationDate |
2014-12-03-04:00^^<http://www.w3.org/2001/XMLSchema#date> |
| publicationNumber |
KR-20140138042-A |
| titleOfInvention |
Semiconductor device test socket |
| abstract |
The present invention relates to a test socket for electrically connecting a device under test and a test board. Wherein the test socket comprises a plurality of pogo pins having an electrode that moves downward when contacted by a plurality of connection terminals of the device under test due to elasticity and is able to return to its original position upon contact release, An electron to heat conversion plate, and a heat sink wall formed at a predetermined height on the electro-thermal conversion plate to isolate the plurality of pogo pins. According to the test socket, it is possible to prevent the interference due to the signal between the pogo pins, thereby improving the performance of the device under testing. |
| isCitedBy |
http://rdf.ncbi.nlm.nih.gov/pubchem/patent/KR-102267346-B1
http://rdf.ncbi.nlm.nih.gov/pubchem/patent/KR-20200027656-A |
| priorityDate |
2013-05-22-04:00^^<http://www.w3.org/2001/XMLSchema#date> |
| type |
http://data.epo.org/linked-data/def/patent/Publication |