Predicate |
Object |
assignee |
http://rdf.ncbi.nlm.nih.gov/pubchem/patentassignee/MD5_9d527f9a5c3e991a1797de3518a88d14 |
classificationCPCAdditional |
http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/G01R1-06738 http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/G01R1-06716 http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/Y10T29-4913 http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/G01R1-07307 http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/G01R1-06755 |
classificationCPCInventive |
http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/G01R3-00 |
classificationIPCInventive |
http://rdf.ncbi.nlm.nih.gov/pubchem/patentipc/G01R1-067 http://rdf.ncbi.nlm.nih.gov/pubchem/patentipc/G01R31-26 http://rdf.ncbi.nlm.nih.gov/pubchem/patentipc/H01L21-66 |
filingDate |
2013-03-07-04:00^^<http://www.w3.org/2001/XMLSchema#date> |
inventor |
http://rdf.ncbi.nlm.nih.gov/pubchem/patentinventor/MD5_6c353cfc33c4c5a87553bf2f69951dfd |
publicationDate |
2014-11-21-04:00^^<http://www.w3.org/2001/XMLSchema#date> |
publicationNumber |
KR-20140134286-A |
titleOfInvention |
Fine pitch probe array from bulk material |
abstract |
A fine pitch probe array is formed from a bulk material. According to a first method embodiment, the article of manufacture comprises an array of probes. Each probe includes a probe tip adapted to contact an integrated circuit inspection point. Each probe tip is mounted on a probe finger structure. All probe finger structures in the array have the same material particle structure. The probe fingers are configured to have a nonlinear profile and / or to act like a spring. |
isCitedBy |
http://rdf.ncbi.nlm.nih.gov/pubchem/patent/KR-20190034687-A |
priorityDate |
2012-03-07-04:00^^<http://www.w3.org/2001/XMLSchema#date> |
type |
http://data.epo.org/linked-data/def/patent/Publication |