http://rdf.ncbi.nlm.nih.gov/pubchem/patent/KR-20140116756-A

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filingDate 2013-03-25-04:00^^<http://www.w3.org/2001/XMLSchema#date>
inventor http://rdf.ncbi.nlm.nih.gov/pubchem/patentinventor/MD5_5b136830257f555100288b09a1ab552c
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publicationDate 2014-10-06-04:00^^<http://www.w3.org/2001/XMLSchema#date>
publicationNumber KR-20140116756-A
titleOfInvention Quantitative analysis method for abosorber layer of solar cell
abstract The present invention relates to a quantitative analysis method for a solar cell light absorbing layer, comprising the steps of generating cluster ions in a reference sample of a solar cell light absorbing layer and a sample to be analyzed, measuring the ion intensity of each cluster ion measured in the depth direction of the reference sample, Calculating relative sensitivities of the cluster ions based on the concentration of each component contained in the sample, and calculating the relative sensitivity of the cluster ions based on the ion intensity of each cluster ion measured in the depth direction of the sample to be analyzed and the relative sensitivity And calculating a relative fraction of cluster ions contained in the sample, respectively.
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