http://rdf.ncbi.nlm.nih.gov/pubchem/patent/KR-20140041950-A

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filingDate 2008-06-13-04:00^^<http://www.w3.org/2001/XMLSchema#date>
inventor http://rdf.ncbi.nlm.nih.gov/pubchem/patentinventor/MD5_a5630afa6ad0f8c9d994ee70670a3310
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publicationDate 2014-04-04-04:00^^<http://www.w3.org/2001/XMLSchema#date>
publicationNumber KR-20140041950-A
titleOfInvention Amorphous composite oxide film, crystalline composite oxide film, amorphous composite oxide film production method, crystalline composite oxide film production method and composite oxide sintered body
abstract Substantially composed of indium, tin, magnesium and oxygen, tin is in the ratio of 5 to 15% by the atomic ratio of Sn / (In + Sn + Mg), and magnesium is in the atomic ratio of Mg / (In + Sn + Mg) It is contained in the ratio of 0.1 to 2.0%, remainder is an amorphous film which consists of indium and oxygen, and annealing at the temperature of 260 degreeC or less, crystallizes a film, and the resistivity of a film becomes 0.4 m (ohm) or less, It is characterized by the above-mentioned. That's it. ITO-based thin films used for display electrodes for flat panel displays, etc. are sputtered into a film without adding water at the time of film-forming by unheating a substrate, and an amorphous ITO-based film is obtained, and the ITO-based film is not more than 260 ° C. An object of the present invention is to provide an ITO-based film having a characteristic of crystallization by annealing rather than high temperature and having low resistivity after crystallization, a method for producing the film, and a sintered body for producing the film.
priorityDate 2007-06-26-04:00^^<http://www.w3.org/2001/XMLSchema#date>
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