http://rdf.ncbi.nlm.nih.gov/pubchem/patent/KR-20140037322-A
Outgoing Links
Predicate | Object |
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assignee | http://rdf.ncbi.nlm.nih.gov/pubchem/patentassignee/MD5_eeb7bc8afff72b9065a75079ccb0b352 |
classificationCPCInventive | http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/G01R1-0466 http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/G01R31-2863 http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/G01R31-2884 http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/G01R31-2896 http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/G01R3-00 |
classificationIPCInventive | http://rdf.ncbi.nlm.nih.gov/pubchem/patentipc/G01R31-28 http://rdf.ncbi.nlm.nih.gov/pubchem/patentipc/G01R31-26 http://rdf.ncbi.nlm.nih.gov/pubchem/patentipc/H01L21-66 http://rdf.ncbi.nlm.nih.gov/pubchem/patentipc/G01R1-067 |
filingDate | 2012-09-15-04:00^^<http://www.w3.org/2001/XMLSchema#date> |
inventor | http://rdf.ncbi.nlm.nih.gov/pubchem/patentinventor/MD5_3959c51d07085e91f841c7bc12ea27bc http://rdf.ncbi.nlm.nih.gov/pubchem/patentinventor/MD5_946f3dedbb8f5eacef7d76d96884768e http://rdf.ncbi.nlm.nih.gov/pubchem/patentinventor/MD5_05ddbb2a4c7fb9f3d2f6a82d43465f3e |
publicationDate | 2014-03-27-04:00^^<http://www.w3.org/2001/XMLSchema#date> |
publicationNumber | KR-20140037322-A |
titleOfInvention | Test Socket and its Manufacturing Method |
abstract | A test socket and a method of manufacturing the same are disclosed. A test socket according to an embodiment of the present invention includes a signal connection portion electrically contacting a test device such as a semiconductor device, a signal terminal portion contacting the test device or the test board, and a signal connection portion electrically connecting the signal connection portion and the signal terminal portion. A film portion including a signal transmitting portion for connecting the signal portion; And a control unit which is located on one side of the film unit and supports the signal connection unit when the testing device is pressed and contacted in the direction of the signal connection unit and controls the position of the test equipment and the signal connection unit at a predetermined position The manufacturing cost of the test socket having a fine pitch can be reduced, the manufacturing yield can be increased, and the test of the high frequency test apparatus can be reliably performed. |
priorityDate | 2012-09-15-04:00^^<http://www.w3.org/2001/XMLSchema#date> |
type | http://data.epo.org/linked-data/def/patent/Publication |
Incoming Links
Predicate | Subject |
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isDiscussedBy | http://rdf.ncbi.nlm.nih.gov/pubchem/substance/SID419480927 http://rdf.ncbi.nlm.nih.gov/pubchem/compound/CID5641 |
Total number of triples: 22.