| abstract |
The present invention includes a transparent support substrate, a transparent conductive layer, and a cured resin layer disposed between the transparent support substrate and the transparent conductive layer, wherein irregularities are formed on a surface of the cured resin layer facing the transparent conductive layer. In the case where the unevenness analysis image obtained by analyzing the shape of the unevenness by the atomic force microscope is subjected to a two-dimensional high-speed Fourier transform process to obtain a Fourier transform image, the absolute value of the wavenumber is 0. A circular or toroidal shape having an origin of approximately 1 μm −1 as a center is shown, and the circular or toric shape is present in a region where the absolute value of the wave number is within a range of 0.5 to 10 μm −1 . It provides a transparent conductive substrate for a solar cell. |