http://rdf.ncbi.nlm.nih.gov/pubchem/patent/KR-20130007437-A

Outgoing Links

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assignee http://rdf.ncbi.nlm.nih.gov/pubchem/patentassignee/MD5_268be9afa00cf55b5aa72b1612151ecb
classificationCPCInventive http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/H01L21-32134
http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/H01L21-6708
classificationIPCInventive http://rdf.ncbi.nlm.nih.gov/pubchem/patentipc/H01L21-306
filingDate 2012-06-19-04:00^^<http://www.w3.org/2001/XMLSchema#date>
inventor http://rdf.ncbi.nlm.nih.gov/pubchem/patentinventor/MD5_a9cc9ccffa31b8a092f6edd7dcb7a989
publicationDate 2013-01-18-04:00^^<http://www.w3.org/2001/XMLSchema#date>
publicationNumber KR-20130007437-A
titleOfInvention Etching method and etching liquid used for this, manufacturing method of semiconductor substrate product using this
abstract The present invention enables selective wet etching that preferentially dissolves a layer containing Ti, and also enables the etching method capable of effectively cleaning and removing residues generated by etching and ashing, the etching solution used for the semiconductor, and the semiconductor using the same. Provided are methods for producing a substrate product. A method of applying a specific etching solution to a semiconductor substrate having a first layer comprising Ti and a second layer comprising at least one of Cu, SiO, SiN, SiOC, and SiON, and selectively etching the first layer. The specific etching liquid contains the basic compound which consists of organic amine compounds, and an oxidizing agent in an aqueous medium, and the pH is 7-14.
isCitedBy http://rdf.ncbi.nlm.nih.gov/pubchem/patent/KR-20160048087-A
priorityDate 2011-06-30-04:00^^<http://www.w3.org/2001/XMLSchema#date>
type http://data.epo.org/linked-data/def/patent/Publication

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