| Predicate |
Object |
| assignee |
http://rdf.ncbi.nlm.nih.gov/pubchem/patentassignee/MD5_90e6a1f0758b9671659a8d3895eab9c1 |
| classificationCPCAdditional |
http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/G01R1-07314 |
| classificationCPCInventive |
http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/G01R1-18
http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/G01R1-07357
http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/G01R1-067
http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/G01R1-0416
http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/H01L22-00
http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/G01R31-2601
http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/G01R1-073
http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/G01R31-26 |
| classificationIPCInventive |
http://rdf.ncbi.nlm.nih.gov/pubchem/patentipc/G01R31-26
http://rdf.ncbi.nlm.nih.gov/pubchem/patentipc/G01R1-067 |
| filingDate |
2011-06-08-04:00^^<http://www.w3.org/2001/XMLSchema#date> |
| inventor |
http://rdf.ncbi.nlm.nih.gov/pubchem/patentinventor/MD5_11fb9a4c597da9ea0b0960764f7edeca |
| publicationDate |
2012-12-18-04:00^^<http://www.w3.org/2001/XMLSchema#date> |
| publicationNumber |
KR-20120136109-A |
| titleOfInvention |
Probe Device for Chip Inspection |
| abstract |
TECHNICAL FIELD The present invention relates to a probe device for inspecting the quality of a semiconductor chip, and discloses a chip inspection probe device excellent in reliability and durability. The present invention is a printed circuit board having a through hole in the center; A pin holder attached to the front surface of the printed circuit board and having a plurality of pin holes; A plurality of probe pins formed in an L shape and having horizontal ends connected to one side ends of circuit patterns provided in the printed circuit board, and vertical ends exposed to an upper surface of the pin hole; And a back cover attached to a rear surface of the printed circuit board. |
| priorityDate |
2011-06-08-04:00^^<http://www.w3.org/2001/XMLSchema#date> |
| type |
http://data.epo.org/linked-data/def/patent/Publication |