Predicate |
Object |
classificationCPCInventive |
http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/H01L21-022 http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/H01L21-02181 http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/H01L21-02178 http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/H01L21-02186 http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/H01L29-7926 http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/H01L21-02164 http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/H01L21-02304 http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/H01L21-0228 http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/H01L21-02189 http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/H01L28-91 http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/H01L21-02312 http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/H01L29-40117 http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/H10B12-033 http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/H10B12-318 http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/H01L21-76877 http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/H10B43-27 http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/H10B43-35 http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/H01L29-66795 |
classificationIPCInventive |
http://rdf.ncbi.nlm.nih.gov/pubchem/patentipc/H01L21-205 http://rdf.ncbi.nlm.nih.gov/pubchem/patentipc/C23C16-44 http://rdf.ncbi.nlm.nih.gov/pubchem/patentipc/C23C16-448 |
filingDate |
2012-03-20-04:00^^<http://www.w3.org/2001/XMLSchema#date> |
publicationDate |
2012-11-07-04:00^^<http://www.w3.org/2001/XMLSchema#date> |
publicationNumber |
KR-20120122887-A |
titleOfInvention |
Method for forming oxide layer and method for manufacturing semiconductor device comprising same |
abstract |
The present invention comprises forming a layer of reaction inhibitory functions on the substrate surface; Forming a layer of a metal precursor or a semiconductor precursor over the layer of reaction inhibiting functionalities; And oxidizing the metal precursor or the semiconductor precursor to obtain a layer of the metal oxide or the semiconductor oxide. By using the oxide layer formation method of the present invention concept, it is possible to form an oxide layer having excellent step coverage and to produce a semiconductor device having excellent electrical characteristics. |
isCitedBy |
http://rdf.ncbi.nlm.nih.gov/pubchem/patent/KR-20190085630-A http://rdf.ncbi.nlm.nih.gov/pubchem/patent/US-10468256-B2 http://rdf.ncbi.nlm.nih.gov/pubchem/patent/US-11739422-B2 http://rdf.ncbi.nlm.nih.gov/pubchem/patent/US-10468264-B2 http://rdf.ncbi.nlm.nih.gov/pubchem/patent/US-9437420-B2 http://rdf.ncbi.nlm.nih.gov/pubchem/patent/US-11411069-B2 http://rdf.ncbi.nlm.nih.gov/pubchem/patent/US-10103026-B2 |
priorityDate |
2011-04-28-04:00^^<http://www.w3.org/2001/XMLSchema#date> |
type |
http://data.epo.org/linked-data/def/patent/Publication |