http://rdf.ncbi.nlm.nih.gov/pubchem/patent/KR-20120082116-A

Outgoing Links

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classificationCPCInventive http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/G01R31-2867
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http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/H01L21-67011
http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/G01R31-2601
http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/G01R31-2862
classificationIPCInventive http://rdf.ncbi.nlm.nih.gov/pubchem/patentipc/H01L21-66
http://rdf.ncbi.nlm.nih.gov/pubchem/patentipc/G01R31-26
filingDate 2011-01-13-04:00^^<http://www.w3.org/2001/XMLSchema#date>
inventor http://rdf.ncbi.nlm.nih.gov/pubchem/patentinventor/MD5_334e00dc9aaa3bfca2b2ba12c4e327a7
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publicationDate 2012-07-23-04:00^^<http://www.w3.org/2001/XMLSchema#date>
publicationNumber KR-20120082116-A
titleOfInvention Pushing mechanism for semiconductor device test and test handler including the same
abstract The pushing mechanism for testing a semiconductor device includes a plate, at least one pusher block and at least one connection block. The plate is mounted with a drive substrate having a socket. The pusher block is mounted to the plate so as to face the insert containing the semiconductor element of the test tray, and includes a pushing unit for pushing the semiconductor element to the test terminal of the test apparatus and a heating unit for heating the semiconductor element. The connection block is mounted to the pusher block and has a plug that protrudes to be inserted into the socket when the pusher block is mounted to the plate while in electrical connection with the heating portion.
isCitedBy http://rdf.ncbi.nlm.nih.gov/pubchem/patent/KR-20140101458-A
http://rdf.ncbi.nlm.nih.gov/pubchem/patent/KR-101452113-B1
http://rdf.ncbi.nlm.nih.gov/pubchem/patent/KR-20190073818-A
http://rdf.ncbi.nlm.nih.gov/pubchem/patent/KR-20190026341-A
http://rdf.ncbi.nlm.nih.gov/pubchem/patent/KR-20210080047-A
priorityDate 2011-01-13-04:00^^<http://www.w3.org/2001/XMLSchema#date>
type http://data.epo.org/linked-data/def/patent/Publication

Incoming Links

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Total number of triples: 25.