http://rdf.ncbi.nlm.nih.gov/pubchem/patent/KR-20120068919-A
Outgoing Links
| Predicate | Object |
|---|---|
| assignee | http://rdf.ncbi.nlm.nih.gov/pubchem/patentassignee/MD5_41ac7ff6ab574ca3737b892da2ebfe6f |
| classificationCPCAdditional | http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/Y02E60-10 http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/H01M10-4285 http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/H01M10-052 http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/H01M10-4207 http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/Y02P70-50 http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/G01R31-52 |
| classificationCPCInventive | http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/H01M10-052 http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/G01R31-367 http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/G01R31-385 http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/G01R31-3865 http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/H01M10-4207 |
| classificationIPCInventive | http://rdf.ncbi.nlm.nih.gov/pubchem/patentipc/G01R31-36 http://rdf.ncbi.nlm.nih.gov/pubchem/patentipc/H01M10-04 http://rdf.ncbi.nlm.nih.gov/pubchem/patentipc/H01M10-44 |
| filingDate | 2009-09-24-04:00^^<http://www.w3.org/2001/XMLSchema#date> |
| inventor | http://rdf.ncbi.nlm.nih.gov/pubchem/patentinventor/MD5_3b4afbc75168757a986b4ce96498cb3a http://rdf.ncbi.nlm.nih.gov/pubchem/patentinventor/MD5_7b58fefe7cf79fb1330bb6f30728df16 http://rdf.ncbi.nlm.nih.gov/pubchem/patentinventor/MD5_89dea58a3a04d95250da177648f0ffae |
| publicationDate | 2012-06-27-04:00^^<http://www.w3.org/2001/XMLSchema#date> |
| publicationNumber | KR-20120068919-A |
| titleOfInvention | Manufacturing method of secondary battery |
| abstract | This invention provides the manufacturing method of the secondary battery which can select | recover the secondary battery which has a defect resulting from a micro short circuit with good precision. The manufacturing method (S1) of a secondary battery is equipped with the inspection process (S70) which selects the secondary battery (1) which has the defect resulting from a micro short circuit among the some secondary battery (1). The inspection step (S70) includes a self discharge test in which the plurality of secondary batteries 1 are left at room temperature for a predetermined time, the electrostatic capacitance C before the self discharge test of the plurality of secondary batteries 1, and The first reference voltage Vi0 and the second reference voltage Vi1 calculated from the time t required for the self discharge test, and the open circuit voltage before and after the self discharge test in the plurality of secondary batteries 1. ) And a short circuit of the selected secondary battery 1 from the first voltage Vs0 and the second voltage Vs1 which are open circuit voltages before and after one self discharge test selected from among the plurality of secondary batteries 1. The resistance Rs is calculated, and when the short circuit resistance Rs is equal to or less than a predetermined prescribed value, it is determined that the defect is caused by a small short circuit. |
| isCitedBy | http://rdf.ncbi.nlm.nih.gov/pubchem/patent/US-11152650-B2 http://rdf.ncbi.nlm.nih.gov/pubchem/patent/WO-2019151654-A1 http://rdf.ncbi.nlm.nih.gov/pubchem/patent/KR-101471775-B1 |
| priorityDate | 2009-09-24-04:00^^<http://www.w3.org/2001/XMLSchema#date> |
| type | http://data.epo.org/linked-data/def/patent/Publication |
Incoming Links
Total number of triples: 32.